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IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 678 - 682
IEEE Transactions on Electron Devices > 2014 > 61 > 8 > 2820 - 2826
2012 IEEE International Reliability Physics Symposium (IRPS) > EM.3.1 - EM.3.5
SPEEDAM 2010 > 140 - 147
IEEE Transactions on Electron Devices > 2010 > 57 > 2 > 448 - 457
IEEE Sensors Journal > 2008 > 8 > 7 > 1324 - 1329