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2016 IEEE International Reliability Physics Symposium (IRPS) > 6C-2-1 - 6C-2-5
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 3 > 1174 - 1178
IEEE Electron Device Letters > 2015 > 36 > 12 > 1380 - 1383
IEEE Transactions on Electron Devices > 2015 > 62 > 9 > 2992 - 2997
IEEE Journal on Emerging and Selected Topics in Circuits and Systems > 2015 > 5 > 2 > 205 - 213
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2014 > 22 > 8 > 1815 - 1828
IEEE Transactions on Magnetics > 2014 > 50 > 6-2 > 1 - 7
IEEE Electron Device Letters > 2014 > 35 > 2 > 205 - 207
IEEE Transactions on Electron Devices > 2012 > 59 > 9 > 2357 - 2362
IEEE Micro > 2012 > 32 > 3 > 79 - 87
2011 International Reliability Physics Symposium > 2G.2.1 - 2G.2.6