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2016 IEEE International Electron Devices Meeting (IEDM) > 4.2.1 - 4.2.4
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 11 > 2657 - 2670
IEEE Electron Device Letters > 2015 > 36 > 9 > 975 - 977
2015 IEEE International Reliability Physics Symposium > MY.1.1 - MY.1.5
2015 IEEE International Reliability Physics Symposium > 5B.6.1 - 5B.6.6
IEEE Transactions on Information Forensics and Security > 2014 > 9 > 6 > 921 - 932
2013 IEEE International Electron Devices Meeting > 22.1.1 - 22.1.4
2013 5th IEEE International Memory Workshop > 100 - 103
2013 IEEE International Reliability Physics Symposium (IRPS) > MY.5.1 - MY.5.4
IEEE Transactions on Computers > 2013 > 62 > 10 > 2083 - 2095