Advanced search
Advanced search
IEEE Transactions on Electron Devices > 2015 > 62 > 8 > 2606 - 2613
IEEE Transactions on Industrial Informatics > 2015 > 11 > 4 > 987 - 996
IEEE Transactions on Power Electronics > 2015 > 30 > 5 > 2721 - 2732
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1455 - 1459
IEEE Transactions on Electron Devices > 2014 > 61 > 8 > 2920 - 2927
2013 IEEE International Electron Devices Meeting > 31.5.1 - 31.5.4
2013 Proceedings of the ESSCIRC (ESSCIRC) > 395 - 398
2013 IEEE International Reliability Physics Symposium (IRPS) > MY.10.1 - MY.10.4
2013 IEEE International Reliability Physics Symposium (IRPS) > MY.3.1 - MY.3.4
IEEE Instrumentation & Measurement Magazine > 2013 > 16 > 5 > 47 - 52
IEEE Electron Device Letters > 2013 > 34 > 3 > 387 - 389
IEEE Transactions on Industrial Electronics > 2013 > 60 > 2 > 789 - 798
IEEE Transactions on Electromagnetic Compatibility > 2012 > 54 > 5 > 1112 - 1124
IEEE Electron Device Letters > 2012 > 33 > 7 > 1063 - 1065