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IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 3 > 1003 - 1014
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3812 - 3819
IEEE Transactions on Wireless Communications > 2014 > 13 > 10 > 5690 - 5698
IEEE Transactions on Electron Devices > 2014 > 61 > 8 > 2920 - 2927
2013 IEEE International Electron Devices Meeting > 31.5.1 - 31.5.4
2013 IEEE International Reliability Physics Symposium (IRPS) > MY.10.1 - MY.10.4
2013 IEEE International Reliability Physics Symposium (IRPS) > MY.3.1 - MY.3.4
IEEE Instrumentation & Measurement Magazine > 2013 > 16 > 5 > 47 - 52
IEEE Journal of Solid-State Circuits > 2013 > 48 > 12 > 3049 - 3058
IEEE Journal of Solid-State Circuits > 2013 > 48 > 12 > 3028 - 3037