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This paper presents a novel design for photovoltaic supply system fed multilevel inverter; the proposed MLI topology is needed only 12 switches and no extra clamping devices required unlike others MLI's; which make it unique and suitable modulation technique provide the reliable single stage conversion with PV system. The modulation technique used is for tracking maximum power point and also to converts...
This paper provides an aspect of coming PV technology taking into account the paradigm shift of recent PV industry and market, i.e. material to system. In the early stage of the PV technology, the solar cell material and device for aiming at higher efficiency and lower cost have been emphasized, because more than 60% of the total cost is shared by solar cells. As the cost of solar cells is going down...
The scope for module level power electronics (MLPE) is immense in modern day PV industry but it lacks in assessing the reliability. This paper presents the work performed by PREDICTS (Physics of Reliability: Evaluating Design Insights for Component Technologies in Solar) team lead by Sandia National Laboratories to develop a standard reliability assessment protocol for MLPE including microinverters...
Performance and reliability evaluation and analysis of three concentrating photovoltaic (CPV) systems or power plants are presented at the string levels excluding the thermal and module level analyses. These plants are located in Arizona and were commissioned in mid-2012 (about 2 years old). The strings in all three power plants are operating between 79% and 0% of the rated capacity, and the average...
Electrical systems mainly generate, transmit and distribute electrical energy through ac voltage for more than a century. But, during the recent decades, some new modifications in electrical systems, such as the fast promising growth of renewable sources, storage systems and dc loads, are changing the circumstances gradually. Considering newly emerged conditions, it seems necessary to study again...
The photovoltaic industry is growing rapidly. In North America, over the past decade, the number of commercially available products and companies devoting resources to this industry has grown substantially. This past year saw the debut of a number of new technologies and new corporate entrants into the market. Utility-scale project size continues to grow and break records. In 2009 module efficiencies...
We present a practical, systematical method for the evaluation of the soft error rate (SER) of microelectronic devices. Existing methodologies, practices and tools are integrated in a common approach while highlighting the need for specific data or tools. The showcased method is particularly adapted for evaluating the SER of very complex microelectronic devices by engineers confronted to increasingly...
In this paper, we present a new technique to improve the reliability of H-tree SRAM memories. This technique deals with the SRAM power-bus monitoring by using built-in current sensor (BICS) circuits that detect abnormal current dissipation in the memory power-bus. This abnormal current is the result of a single-event upset (SEU) in the memory and it is generated during the inversion of the state of...
A planar edge termination technique of trenched field limiting ring is investigated by using 2-dimensional numerical analysis and simulation. The better voltage blocking capability and reliability can be obtained by trenching the field-limiting ring site which would be implanted. The trench etch step makes the junction depth deeper so that junction curvature effect and surface breakdown are less happened...
Continuous scaling, necessary for enhanced performance and cost reduction, has pushed existing CMOS materials much closer to their intrinsic reliability limits, forcing reliability engineers to get a better understanding of circuit failure. This requires that designers will have to be very careful with phenomena such as high current densities or voltage overshoots. In addition to the reliability issues,...
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