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Journal of Electronic Testing > 2019 > 35 > 3 > 413-420
IEEE Transactions on Information Theory > 2018 > 64 > 1 > 577 - 592
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 211 - 215
IEEE Transactions on Information Theory > 2018 > 64 > 1 > 192 - 204
IEEE Transactions on Information Theory > 2018 > 64 > 1 > 249 - 256
IEEE Transactions on Information Theory > 2018 > 64 > 1 > 257 - 273
IEEE Transactions on Information Theory > 2018 > 64 > 1 > 622 - 639
Przegląd Telekomunikacyjny + Wiadomości Telekomunikacyjne > 2018 > nr 6 > 367--372, CD
IEEE Design & Test > 2017 > 34 > 6 > 84 - 93
IEEE Transactions on Information Theory > 2017 > 63 > 12 > 7676 - 7686
IEEE Journal on Emerging and Selected Topics in Circuits and Systems > 2017 > 7 > 4 > 594 - 603
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 802 - 804
IEEE Transactions on Information Theory > 2017 > 63 > 12 > 7617 - 7619
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 713 - 721
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 698 - 707
IET Communications > 2017 > 11 > 17 > 2575 - 2584
IEEE Transactions on Circuits and Systems for Video Technology > 2017 > 27 > 11 > 2476 - 2489