The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
In this paper, we present a novel technique to model crystal impurities in III-V semiconductors at the material level, within the empirical sp3d5s∗ tight-binding (TB) framework. Regular semiconductor atoms are replaced by so-called “impurity atoms” whose TB parameters are adjusted to create single trap states characterized by a flat E-k dispersion. With the help of two dimensionless parameters, the...
How temperate forests will respond to climate change is uncertain; projections range from severe decline to increased growth. We conducted field tests of sessile oak (Quercus petraea), a widespread keystone European forest tree species, including more than 150 000 trees sourced from 116 geographically diverse populations. The tests were planted on 23 field sites in six European countries, in order...
In this paper, we present an identification method for mechatronic systems consisting of a linear part with unknown parameters and an unknown nonlinearity (systems with an isolated nonlinearity). Based on this identification method we introduce an adaptive state space controller in order to generate an overall linear system behavior. A structured recurrent neural network is used to identify the usknown...
A comprehensive description of band gap and effective masses of III–V semiconductor bulk and ultra-thin body (UTB) structures under realistic biaxial and uniaxial strain is given using numerical simulations from four different electronic structure codes. The consistency between the different tools is discussed in depth. The nearest neighbor sp3d5s* empirical tight-binding model is found to reproduce...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.