Search results for: Nicola Delmonte
Microelectronics Reliability > 2018 > 80 > C > 223-229
IEEE Transactions on Industry Applications > 2017 > 53 > 6 > 5687 - 5697
IEEE Transactions on Instrumentation and Measurement > 2016 > 65 > 1 > 37 - 45
IEEE Transactions on Industry Applications > 2016 > 52 > 2 > 1698 - 1710
Microelectronics Reliability > 2009 > 49 > 9-11 > 1293-1298