Search results for: Paolo Cova
Microelectronics Reliability > 2018 > 80 > C > 223-229
IEEE Transactions on Industry Applications > 2017 > 53 > 6 > 5687 - 5697
IEEE Transactions on Instrumentation and Measurement > 2016 > 65 > 1 > 37 - 45
IEEE Transactions on Industry Applications > 2016 > 52 > 2 > 1698 - 1710
2013 IEEE Energy Conversion Congress and Exposition > 5294 - 5300
Microelectronics Reliability > 2009 > 49 > 9-11 > 1293-1298
Microelectronics Reliability > 1999 > 39 > 6-7 > 1165-1170
Microelectronics Reliability > 1999 > 39 > 6-7 > 1073-1078
Microelectronics Reliability > 1997 > 37 > 7 > 1131-1135