Search results for: Alberto Bosio
Journal of Electronic Testing > 2019 > 35 > 3 > 367-381
Journal of Electronic Testing > 2019 > 35 > 2 > 145-162
Journal of Electronic Testing > 2018 > 34 > 4 > 375-387
Microelectronics Reliability > 2018 > 80 > C > 241-248
Microprocessors and Microsystems > 2017 > 50 > C > 102-112
Advanced Test Methods for SRAMs > 133-158