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The Semiconductor Industry is not only the driver in the Electronics Industry, the world's largest and fastest growing industry, but is also important in its own because of its size (100 B$ today, 1,000,000 people directly involved). The growth in this industry is three-fold: By 1998, sales will grow from 100 B$ today to over 200 B$, complexity will exceed 10 M gates per IC, and the innovation rate...
The term EMC (Electromagnetic Compatibility) includes, as generally might be known, all actions intended to eliminate electromagnetic interference in electronic systems. Challenges faced in the microelectronic area include growing systems complexity, higher operating speed, denser design at all levels of integration (chip, printed circuit board, MCM and system).
Since their introduction in 1985, Field Programmable Gate Arrays (FPGAs) have become a preferred medium for implementing digital logic designs. The increased popularity of FPGAs results from significantly increased capability of FPGAs. This paper discusses the progress of FPGA technology in three areas: manufacturing process, architecture and software; and forecasts FPGA capabilities in the future.
The interaction between silicon process evolution and design methodology and CAD tools for microprocessor technology will be described since the first commercial microprocessors to the present time.
The aim of this contribution is to present and discuss a methodology for the Development/Design and the Reliability/Quality Assurance of advanced Application Specific Integrated Circuits for digital, analog and microwave space applications. Starting from the technical and managerial requirements of space projects, the presentation shows today's procedure to fly advanced microelectronics. Areas of...
Micromachined mechanics, magnetics and optics allow in conjunction with microelectronics the development of various microsystems. Scaling, co-integration and introduction of arrays of sensors and actuators render the task of the designer difficult. Innovations are required at the building block and system level.
The goal of this paper is to review the design of circuits and systems featuring testing capabilities. Those capabilities include self-checking properties necessary for on-line testing as well as BIST. The design of fail-safe reliable ASICs and boards is broadly addressed. The basic milestones over the last 25 years are reviewed and longterm perspectives are discussed.
A fully differential amplifier that operates from a 3.3V±??10% power-supply and featuring a -100dB THD at 2Vpp output voltage was realized. Equivalent input noise in the 100Hz - 10kHz audio-band is IμVrms, leading to a 120dB SNR. This amplifier is used as the core of a programmable gain cell in the front-end part of a ΣΔ A/D converter. The good linearity performances are achieved thanks to a novel...
This paper presents the read section of a 10-channel preamplifier for hard-disk-drive applications that use magneto-resistive-read/inductive-write heads. Ten dedicated low-noise amplifier stages use a current-bias current-sense architecture with grounded magneto-resistive (MR) heads. The amplifier also contains gain stages common to all heads, a high-frequency gain-boost, an MR bias current-DAC and...
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