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Drastic increase in design complexity along with the emergence of new failure mechanisms in the nanometer regime has led to significant increase in the complexity of verification, validation, and debug of integrated circuits. In spite of extensive efforts, it is not always possible to detect all the functional errors and electrical faults during pre-silicon validation. Post-silicon validation is used...
Summary form only given. As conventional memory technologies such as DRAM run into the scaling wall, architects and system designers are forced to look at alternative technologies for building future computer systems. Several emerging Non-Volatile Memory (NVM) technologies such as PCM, STT-RAM, and Memristors have the potential to boost memory capacity in a scalable and power-efficient manner. However,...
Summary form only given. Some recent developments from the field of nanotechnology that lay the stepping stones to deliver on this challenge will be discussed. It has been demonstrated that nanoscale devices made of chalcogenide alloys, Ag2S, TiO2 etc, could be programmed with picojoule level energy consumption to mimic the plasticity properties exhibited by biological synapses. Small prototype circuits...
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