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The complete presentation was not made available for publication as part of the conference proceedings. Provides a brief professional biography of the presenter.
This keynote is a tribute to the late Prof. Mel Breuer, entitled Contributions to CAD and Test. It is organized by Sandeep Gupta. A panel of three prominent speakers gives this keynote. The three speakers are Miron Abramovici, Magdy Abadir and Sridhar Narayanan.
In recent years early life failures have caused several product recalls in semiconductor and automotive industries associated with a loss of billions of dollars. They can be traced back to various root-causes. In embedded or cyber-physical systems, the interaction with the environment and the behavior of the hardware/software interface are hard to predict, which may lead to unforeseen failures. In...
Industry continues to grapple with analog test in terms of the right set of parameters to be tested and the right set of tests and measurements required for them. On one hand, is the growing analog content in today's ICs, and on the other, is the need to optimise test and characterization to make it affordable and timely across different quality and reliability requirements laid down by the application...
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