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In recent years early life failures have caused several product recalls in semiconductor and automotive industries associated with a loss of billions of dollars. They can be traced back to various root-causes. In embedded or cyber-physical systems, the interaction with the environment and the behavior of the hardware/software interface are hard to predict, which may lead to unforeseen failures. In...
This paper proposes an approach for testing of safety critical systems. It is based on a behavioral and a fault model. The two models are analyzed for compatibility and necessary changes are identified to make them compatible. Then transformation rules are used to transform the fault model into the same model type as the behavioral model. Integration rules define how to combine them. This approach...
High power consumption in scan testing can cause undue yield loss which has increasingly become a serious problem for deep-submicron VLSI circuits. Growing evidence attributes this problem to shift timing failures, which are primarily caused by excessive switching activity in the proximities of clock paths that tends to introduce severe clock skew due to IR-drop-induced delay increase. This paper...
Test compression has become a de facto technique in VLSI testing. Meanwhile, excessive capture power of at-speed testing has also become a serious concern. Therefore, it is important to co-optimize test power and compression ratio in at-speed testing. In this paper, a novel X-filling framework is proposed to reduce capture power of both LoC and LoS at-speed testing, which is applicable for different...
This paper presents principles and results of dynamic testing of an SRAM-based FPGA using time- resolved fault injection with a pulsed laser. The synchronization setup and experimental procedure are detailed. Fault injection results obtained with a DES crypto-core application implemented on a Xilinx Virtex II are discussed.
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient errors during system operation are no longer restricted to memories but also affect random logic, and a robust design becomes mandatory to ensure a reliable system operation. Self-checking circuits rely on redundancy to detect...
As software systems are encompassing a wide range of fields and applications, software reliability becomes a crucial step. The need for safety analysis and test cases that have high probability to uncover plausible faults are necessities in proving software quality. System models that represent only the operational behavioral of a system are incomplete sources for deriving test cases and performing...
In the paper we describe a method to extract the topography of an impressed current for our bounded electrical impedance tomography (bEIT) studies. The frequency of the impressed current is low (up to a few hundred Hz), and is buried in background EEG and other noise. For the development of the extraction method, special consideration is given to maximize the signal-to-noise ratio. The standard lock-in...
Capture-safety, defined as the avoidance of any timing error due to unduly high launch switching activity in capture mode during at-speed scan testing, is critical for avoiding test- induced yield loss. Although point techniques are available for reducing capture IR-drop, there is a lack of complete capture-safe test generation flows. The paper addresses this problem by proposing a novel and practical...
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