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2015 IEEE AUTOTESTCON > 374 - 379
2014 IEEE AUTOTEST > 173 - 176
2011 9th IEEE International Conference on ASIC > 828 - 833
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 9 > 1348 - 1356
2008 IEEE AUTOTESTCON > 499 - 503