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2017 IEEE International Reliability Physics Symposium (IRPS) > MR-3.1 - MR-3.6
IEEE Transactions on Electron Devices > 2015 > 62 > 12 > 4148 - 4153
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3521 - 3526
IEEE Electron Device Letters > 2013 > 34 > 12 > 1551 - 1553
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2012 > 2 > 5 > 884 - 889