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IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4084 - 4090
IEEE Electron Device Letters > 2016 > 37 > 10 > 1268 - 1271
2016 IEEE International Reliability Physics Symposium (IRPS) > MY-8-1 - MY-8-5
IEEE Journal on Emerging and Selected Topics in Circuits and Systems > 2015 > 5 > 2 > 205 - 213