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IEEE Journal on Emerging and Selected Topics in Circuits and Systems > 2016 > 6 > 3 > 352 - 363
2011 International Reliability Physics Symposium > 3E.4.1 - 3E.4.4
IEEE Electron Device Letters > 2011 > 32 > 2 > 200 - 202
2010 International Electron Devices Meeting > 16.4.1 - 16.4.4
2010 International Electron Devices Meeting > 33.5.1 - 33.5.4
IEEE Transactions on Electron Devices > 2010 > 57 > 11 > 2821 - 2830