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2011 International Reliability Physics Symposium > 2B.6.1 - 2B.6.5
IEEE Journal of Solid-State Circuits > 2011 > 46 > 1 > 162 - 172
IEEE Transactions on Semiconductor Manufacturing > 2011 > 24 > 3 > 385 - 391
2011 International Reliability Physics Symposium > 2B.6.1 - 2B.6.5
IEEE Journal of Solid-State Circuits > 2011 > 46 > 1 > 162 - 172
IEEE Transactions on Semiconductor Manufacturing > 2011 > 24 > 3 > 385 - 391