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2011 International Reliability Physics Symposium > 2F.3.1 - 2F.3.7
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 98 - 105
2010 International Electron Devices Meeting > 33.5.1 - 33.5.4
IEEE Transactions on Electron Devices > 2010 > 57 > 11 > 2821 - 2830
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 3 > 307 - 316