Advanced search
Advanced search
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 129 - 135
Eurocon 2013 > 1869 - 1872
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 1 - 8
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1388 - 1396
IEEE Transactions on Electron Devices > 2011 > 58 > 10 > 3559 - 3565
IEEE Electron Device Letters > 2007 > 28 > 4 > 312 - 314