Search results for: J. F. Zhang

Items from 1 to 20 out of 91 results

article

Pyran Derivatives: Anti-Breast Cancer Activity and Docking Study

H. Han, Z.-F. Zhang, J.-F. Zhang, B. Zhang

Russian Journal of General Chemistry > 2018 > 88 > 12 > 2664-2668

Four novel pyran derivatives 1–4 are synthesized and characterized by IR, ¹H NMR, HRMS, and single crystal X-ray data. Anticancer activity of the compounds is tested against four human breast cancer cells (HCC1937, HCC70, MDA-MB-436, and BT474) by MTT assay. Molecular docking study supports the biological assay data and suggests that compound 2 has a potential as an anticancer agent.

article

Ship route planning using historical trajectories derived from AIS Data

Y. K. He, D. Zhang, J. F. Zhang, M. Y. Zhang, more

TransNav : International Journal on Marine Navigation and Safety of Sea... > 2019 > Vol. 13, no. 1 > 69--76

Ship route planning is one of the key issues in enhancing traffic safety and efficiency. Many route planning methods have been developed, but most of them are based on the information from charts. This paper proposes a method to generate shipping routes based on historical ship tracks. The ship's historical route information was obtained by processing the AIS data. From which the ship turning point...

article

On the survival of intergranular coesite in UHP eclogite

L. Wang, S.‐J. Wang, M. Brown, J.‐F. Zhang, more

Journal of Metamorphic Geology > 36 > 2 > 173 - 194

Coesite is typically found as inclusions in rock‐forming or accessory minerals in ultrahigh‐pressure (UHP) metamorphic rocks. Thus, the survival of intergranular coesite in UHP eclogite at Yangkou Bay (Sulu belt, eastern China) is surprising and implies locally “dry” conditions throughout exhumation. The dominant structures in the eclogites at Yangkou are a strong D₂ foliation associated with tight‐to‐isoclinal...

article

Partial Least Squares Regression Calibration of an Ultraviolet-Visible Spectrophotometer for Measurements of Chemical Oxygen Demand in Dye Wastewater

W. Mai, J.-F. Zhang, X.-M. Zhao, Z. Li, more

Journal of Applied Spectroscopy > 2017 > 84 > 5 > 804-810

Wastewater from the dye industry is typically analyzed using a standard method for measurement of chemical oxygen demand (COD) or by a single-wavelength spectroscopic method. To overcome the disadvantages of these methods, ultraviolet-visible (UV-Vis) spectroscopy was combined with principal component regression (PCR) and partial least squares regression (PLSR) in this study. Unlike the standard method,...

article

Combining ability, heterosis, and genetic distance among nine elite American Pima cotton genotypes (Gossypium barbadense)

J. F. Zhang, A. Abdelraheem

Euphytica > 2017 > 213 > 11 > 1-13

American Pima cotton (Gossypium barbadense L.) is grown in the southwest United States, and no Pima cotton hybrid is commercially grown. In this study, six commercial Pima cultivars (Pima S-7, Pima S-6, Phy 76, BR 007, DP 340, and DP 744) and three elite germplasm lines (SI 1331, 93252, and 8810) were crossed in a diallel mating scheme without reciprocals, and their 36 F₂ and F₃ progeny were planted...

article

Heterosis, combining ability and genetic effect, and relationship with genetic distance based on a diallel of hybrids from five diverse Gossypium barbadense cotton genotypes

J. F. Zhang, A. Abdelraheem, J. X. Wu

Euphytica > 2017 > 213 > 9 > 1-15

The cultivated tetraploid Gossypium barbadense L. cotton produces superior natural fibers for the textile industry in the world. However, the possibility in utilization of heterosis to further increase its lint yield has not been extensively explored. In this study, two commercial US Pima cotton cultivars and three exotic G. barbadense lines, together with all of their possible hybrids in F₁ and F...

chapter

The as-grown-generation (AG) model: A reliable model for reliability prediction under real use conditions

J. F. Zhang, Z. Ji, W. Zhang

2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) > 1 - 7

2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

Modeling the negative bias temperature instability (NBTI) can optimize circuit design. Several models have been proposed and all of them can fit test data well. These models are extracted typically by fitting short accelerated stress data. Their capability to predict NBTI aging outside the test range has not been fully demonstrated. This predictive capability for long term aging under low operation...

chapter

Interaction between hot carrier aging and PBTI degradation in nMOSFETs: Characterization, modelling and lifetime prediction

M. Duan, J. F. Zhang, J. C. Zhang, W. Zhang, more

2017 IEEE International Reliability Physics Symposium (IRPS) > XT-5.1 - XT-5.7

2017 IEEE International Reliability Physics Symposium (IRPS)

Modelling of the interaction between Hot Carrier Aging (HCA) and Positive Bias Temperature Instability (PBTI) has been considered as one of the main challenges in nanoscale CMOS circuit design. Previous works were mainly based on separate HCA and PBTI instead of Interacted HCA-PBTI Degradation (IHPD). The key advance of this work is to develop a methodology that enables accurate modelling of IHPD...

chapter

Defects and lifetime prediction for GE pMOSFETs under AC NBTI stresses

J. F. Zhang, J. Ma, W. Zhang, Z. Ji

2017 China Semiconductor Technology International Conference (CSTIC) > 1 - 5

2017 China Semiconductor Technology International Conference (CSTIC)

Germanium has higher hole mobility and is a candidate for replacing silicon for pMOSFETs. This work reviews the recent progresses in understanding the negative bias temperature instability (NBTI) of Ge pMOSFETs and compares it with SiON/Si devices. Both Ge and SiON/Si devices have two groups of defects: as-grown hole traps (AHT) and generated defects (GDs). The generation process, however, is different:...

article

Emergency management of maritime accidents in the yangtze river: problems, practice and prospects

X.P. Yan, B. Wu, D. Zhang, J. F. Zhang

TransNav : International Journal on Marine Navigation and Safety of Sea... > 2017 > Vol. 11, no. 1 > 111--118

Maritime accidents have received considerable attentions due to the enormous property damage, casualties and serious environmental pollution. This paper first makes statistical analysis of the different types of maritime accidents in the period of 2012 to 2014 in the Yangtze River. Second, the problems of emergency management of maritime accidents are also proposed from the analysis of the major accident...

chapter

Identify the critical regions and switching/failure mechanisms in non-filamentary RRAM (a-VMCO) by RTN and CVS techniques for memory window improvement

J. Ma, Z. Chai, W. Zhang, B. Govoreanu, more

2016 IEEE International Electron Devices Meeting (IEDM) > 21.4.1 - 21.4.4

2016 IEEE International Electron Devices Meeting (IEDM)

Non-filamentary RRAM is a promising technology that features self-rectifying, forming/compliance-free, tight resistance distributions at both high and low resistance states (HRS/LRS). Direct experimental evidence for its physical switching & failure mechanisms, however, is still missing, due to the lack of suitable characterization techniques. In this work, a novel method combining the random-telegraph-noise...

chapter

Predictive As-grown-Generation (A-G) model for BTI-induced device/circuit level variations in nanoscale technology nodes

R. Gao, Z. Ji, S. M. Hatta, J. F. Zhang, more

2016 IEEE International Electron Devices Meeting (IEDM) > 31.4.1 - 31.4.4

2016 IEEE International Electron Devices Meeting (IEDM)

A new model for assessing NBTI and PBTI induced time-dependent variability under practical operation workloads is proposed. The model is based on a realistic understanding of different types of defects and has excellent predictive capability, as validated by comparison with experimental data. In addition, a new fast wafer-level test scheme for parameter extraction is developed, reducing test time...

chapter

Analysis of RTN signals in resistive-switching RAM device and its correlation with device operations

W. Zhang, Z. Chai, J. Ma, J. F. Zhang, more

2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) > 174 - 177

2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)

Filament rupture/restoration induced by movement of defects, e.g. oxygen ions/vacancies, is considered as the switching mechanism in HfO2 RRAM. However, details of filament alteration during switching are still speculative, due to the limitations of existing experiment-based probing techniques, impeding its understanding. In this work, for the first time, an RTN-based defect tracking technique is...

chapter

Understanding charge traps for optimizing Si-passivated Ge nMOSFETs

P. Ren, R. Gao, Z. Ji, H. Arimura, more

2016 IEEE Symposium on VLSI Technology > 1 - 2

2016 IEEE Symposium on VLSI Technology

For the first time, two different types of electron traps are clearly identified in Ge nFETs with Type-A controlled by the HfO₂ layer thickness and Type-B by the Si growth induced Ge segregation. Only Type-B are responsible for mobility degradation and they do not saturate with stress time, while the opposite applies to Type A. A PBTI model is proposed and validated for the long term prediction.

chapter

RTN-based defect tracking technique: Experimentally probing the spatial and energy profile of the critical filament region and its correlation with HfO₂RRAM switching operation and failure mechanism

Z. Chai, J. Ma, W. Zhang, B. Govoreanu, more

2016 IEEE Symposium on VLSI Technology > 1 - 2

2016 IEEE Symposium on VLSI Technology

For the first time, an RTN based defect tracking technique has been developed that can monitor the defect movement and filament alteration in RRAM devices. Critical filament region has been identified during switching operation at various conditions and new endurance failure mechanism is revealed. This technique provides a useful tool for RRAM technology development.

article

Effect of male body mass index on clinical outcomes following assisted reproductive technology: a meta‐analysis

W. Le, S.‐H. Su, L.‐H. Shi, J.‐F. Zhang, more

Andrologia > 48 > 4 > 406 - 424

Overweight and obese males might exhibit a great risk of infertility. However, according to the current studies, the association between elevated male body mass index (BMI) and the clinical adverse results after assisted reproductive technology (ART) remains controversial. Hence, we conducted a meta‐analysis to evaluate the effects of raised male BMI on clinical outcomes following ART. PubMed, EMBASE...

chapter

Defects for random telegraph noise and negative bias temperature instability

J. F. Zhang, M. Duan, Z. Ji, W. Zhang

2016 China Semiconductor Technology International Conference (CSTIC) > 1 - 3

2016 China Semiconductor Technology International Conference (CSTIC)

Random Telegraphy Noise (RTN) and Negative Bias Temperature Instability (NBTI) are two important sources of device instability. Their relation is not fully understood and is investigated in this work. We examine the similarity and differences of the defects responsible for them. By following the As-grown-Generation (AG) model proposed by our group, we present clear evidences that the As-grown hole...

chapter

Hot carrier aging and its variation under use-bias: Kinetics, prediction, impact on Vdd and SRAM

M. Duan, J. F. Zhang, A. Manut, Z. Ji, more

2015 IEEE International Electron Devices Meeting (IEDM) > 20.4.1 - 20.4.4

2015 IEEE International Electron Devices Meeting (IEDM)

As CMOS scales down, hot carrier aging (HCA) scales up and can be a limiting aging process again. This has motivated re-visiting HCA, but recent works have focused on accelerated HCA by raising stress biases and there is little information on HCA under use-biases. Early works proposed that HCA mechanism under high and low biases are different, questioning if the high-bias data can be used for predicting...

chapter

UWB dual-polarized microstrip antenna with high isolation

J. F. Zhang, P. H. Li, Y. X. Zhou, T. Zhu

2015 IEEE International Conference on Communication Problem-Solving (ICCP) > 303 - 306

2015 IEEE International Conference on Communication Problem-Solving (ICCP)

An ultra-wideband (UWB) dual-polarized microstrip slot antenna with high port isolation and planar structure is presented in this letter. This antenna consists of a monopole and a tapered microstrip feed line, they are used for obtaining UWB characteristic and generating two orthogonal polarization modes. Furthermore, the good impedance matching can be attained through etching slots on the ground...

article

A New Measure of Uncertainty and the Control Loop Performance Assessment for Output Stochastic Distribution Systems

J. L. Zhou, X. Wang, J. F. Zhang, H. Wang, more

IEEE Transactions on Automatic Control > 2015 > 60 > 9 > 2524 - 2529

Minimization of output uncertainty is an important control target for stochastic systems subject to bounded random inputs. Firstly, causes that prevent realization of the minimum Shannon entropy (SE) control are examined based on the analysis of the SE definition in the continuous random variable (CRV) and on this basis, a new measure of uncertainty, which is called rational entropy (RE), is proposed,...

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INFONA - science communication portal

Search results for: J. F. Zhang

Pyran Derivatives: Anti-Breast Cancer Activity and Docking Study

Ship route planning using historical trajectories derived from AIS Data

On the survival of intergranular coesite in UHP eclogite

Partial Least Squares Regression Calibration of an Ultraviolet-Visible Spectrophotometer for Measurements of Chemical Oxygen Demand in Dye Wastewater

Combining ability, heterosis, and genetic distance among nine elite American Pima cotton genotypes (Gossypium barbadense)

Heterosis, combining ability and genetic effect, and relationship with genetic distance based on a diallel of hybrids from five diverse Gossypium barbadense cotton genotypes

The as-grown-generation (AG) model: A reliable model for reliability prediction under real use conditions

Interaction between hot carrier aging and PBTI degradation in nMOSFETs: Characterization, modelling and lifetime prediction

Defects and lifetime prediction for GE pMOSFETs under AC NBTI stresses

Emergency management of maritime accidents in the yangtze river: problems, practice and prospects

Identify the critical regions and switching/failure mechanisms in non-filamentary RRAM (a-VMCO) by RTN and CVS techniques for memory window improvement

Predictive As-grown-Generation (A-G) model for BTI-induced device/circuit level variations in nanoscale technology nodes

Analysis of RTN signals in resistive-switching RAM device and its correlation with device operations

Understanding charge traps for optimizing Si-passivated Ge nMOSFETs

RTN-based defect tracking technique: Experimentally probing the spatial and energy profile of the critical filament region and its correlation with HfO₂RRAM switching operation and failure mechanism

Effect of male body mass index on clinical outcomes following assisted reproductive technology: a meta‐analysis

Defects for random telegraph noise and negative bias temperature instability

Hot carrier aging and its variation under use-bias: Kinetics, prediction, impact on Vdd and SRAM

UWB dual-polarized microstrip antenna with high isolation

A New Measure of Uncertainty and the Control Loop Performance Assessment for Output Stochastic Distribution Systems

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