Search results for: P. Weckx
2017 IEEE International Reliability Physics Symposium (IRPS) > 2D-6.1 - 2D-6.7
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-9.1 - XT-9.5
2017 IEEE International Reliability Physics Symposium (IRPS) > CR-4.1 - CR-4.6
2017 IEEE International Reliability Physics Symposium (IRPS) > 2D-5.1 - 2D-5.6
2017 IEEE International Reliability Physics Symposium (IRPS) > CR-7.1 - CR-7.6
2016 IEEE International Electron Devices Meeting (IEDM) > 15.3.1 - 15.3.4
Solid-State Electronics > 2016 > 125 > C > 52-62
2015 IEEE International Reliability Physics Symposium > 3B.1.1 - 3B.1.6
2015 IEEE International Reliability Physics Symposium > 3B.5.1 - 3B.5.6
2014 IEEE International Reliability Physics Symposium > 5D.2.1 - 5D.2.6
2014 IEEE International Reliability Physics Symposium > 2D.4.1 - 2D.4.6