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This work describes a statistical model for the C-V global variability of 28 nm FD-SOI using the sensitivities of the capacitance to each process parameter calculated using Leti-UTSOI compact model. The percentage contribution of each process parameter to the total C-V variation is explored to identify the dominant source of variation at different bias conditions. The proposed model provides an alternate...
In this work, robust methodologies for parameter extraction using split C-V measurements in FD-SOI structures are developed. These methods enable an automated and robust extraction procedure which is very important from an industrial perspective. The accuracy and robustness of the improved methods are verified using statistical measurements carried out on 28 nm FD-SOI devices and comparison with physical...
A penalty finite element method based simulation is performed to analyze the influence of various walls thermal boundary conditions on mixed convection lid driven flows in a square cavity filled with porous medium. The relevant parameters in the present study are Darcy number (Da=10 −5 −10 −3 ), Grashof number (Gr=10 3 −10 5 ), Prandtl number (Pr=0.7–7.2), and Reynolds...
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