Search results for: Maria K. Michael
Journal of Electronic Testing > 2018 > 34 > 6 > 667-683
Journal of Electronic Testing > 2018 > 34 > 1 > 67-81
IEEE Design & Test > 2017 > 34 > 6 > 119 - 120
IEEE Transactions on Computers > 2016 > 65 > 5 > 1453 - 1466
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 11 > 2447 - 2460
IEEE Design & Test > 2015 > 32 > 2 > 17 - 28
Microprocessors and Microsystems > 2014 > 38 > 6 > 585-597