Search results for: Yiorgos Makris
IEEE Design & Test > 2017 > 34 > 6 > 63 - 76
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 12 > 2120 - 2133
IEEE Transactions on Information Forensics and Security > 2017 > 12 > 10 > 2430 - 2443
IEEE Transactions on Information Forensics and Security > 2017 > 12 > 10 > 2416 - 2429
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 4 > 1506 - 1519
IEEE Design & Test > 2016 > 33 > 3 > 91 - 102