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This paper reports recent single-event latchup results for a variety of microelectronic devices that include an ADC, OpAmp, EEPROM, CPLD, PWM, transceiver, voltage regulator, digital signal processor, step-down converter, buck controller and supervisory circuits. The data were collected to evaluate these devices for possible use in NASA ISS payloads.
Earlier P2020 SEE data are compared and expanded to a recent die revision, significantly increasing samples tested by protons by five devices, and by heavy ions by five devices. Earlier tested SEE types are found to be fairly similar in register, L1 cache, L2 cache, and CPU crashes. New test methods give SEE performance for the flash memory controller, watchdog circuit, and a built-in Ethernet port...
This paper reports heavy ion induced single event effects (SEE) results for a variety of microelectronic devices targeted for possible use in JPL spacecraft. The compendium covers devices tested within the timeframe of August 2015 through July 2017. It is formatted as an update to the SEE compendia JPL has historically published.
We present heavy ion single-event latchup (SEL) screening data for a variety of commercial-off-the-shelf (COTS) devices intended for use on low-cost missions, and discuss the device preparation techniques used to expose the die for ground-based heavy-ion testing.
SEL, SEU, and TID results are presented for microcontrollers and microprocessors of interest for small satellite systems such as the TI MSP430F1611, MSP430F1612 and MSP430FR5739, Microchip PIC24F256GA110 and dsPIC33FJ256GP710, Atmel AT91SAM9G20, and Intel Atom E620T, and the Qualcomm Snapdragon APQ8064.
This paper reports heavy ion, proton, and laser induced single event effects (SEE) results for a variety of microelectronic devices targeted for possible use in JPL spacecraft. The compendium covers devices tested within the timeframe of August 2012 through February 2015. It is an update to the SEE compendia JPL has historically published.
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