Search results for: Mayank Shrivastava
Fire Technology > 2019 > 55 > 4 > 1147-1173
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 191 - 198
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 199 - 206
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 600 - 607
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 608 - 615
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4175 - 4183
2017 IEEE International Reliability Physics Symposium (IRPS) > WB-5.1 - WB-5.5
2017 IEEE International Reliability Physics Symposium (IRPS) > 3F-1.1 - 3F-1.6
IEEE Transactions on Electron Devices > 2017 > 64 > 2 > 481 - 487
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 28 - 36
IEEE Microwave and Wireless Components Letters > 2016 > 26 > 12 > 999 - 1001
2016 IEEE International Electron Devices Meeting (IEDM) > 5.3.1 - 5.3.4