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IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 529 - 531
2011 International Reliability Physics Symposium > 3E.2.1 - 3E.2.5
IEEE Electron Device Letters > 2011 > 32 > 4 > 560 - 562
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 98 - 105