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IEEE Electron Device Letters > 2017 > 38 > 7 > 871 - 874
IEEE Electron Device Letters > 2017 > 38 > 2 > 168 - 171
IEEE Electron Device Letters > 2016 > 37 > 10 > 1268 - 1271
2016 IEEE International Reliability Physics Symposium (IRPS) > MY-8-1 - MY-8-5
IEEE Electron Device Letters > 2016 > 37 > 4 > 404 - 407
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 3 > 1174 - 1178
IEEE Electron Device Letters > 2015 > 36 > 12 > 1380 - 1383
IEEE Electron Device Letters > 2015 > 36 > 10 > 1030 - 1032
IEEE Electron Device Letters > 2015 > 36 > 2 > 138 - 140
IEEE Electron Device Letters > 2014 > 35 > 6 > 636 - 638
IEEE Electron Device Letters > 2014 > 35 > 10 > 1019 - 1021