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2017 IEEE International Reliability Physics Symposium (IRPS) > MR-3.1 - MR-3.6
IEEE Electron Device Letters > 2016 > 37 > 8 > 1048 - 1050
IEEE Electron Device Letters > 2014 > 35 > 5 > 572 - 574
IEEE Electron Device Letters > 2011 > 32 > 2 > 200 - 202
IEEE Electron Device Letters > 2011 > 32 > 6 > 806 - 808
IEEE Transactions on Electron Devices > 2009 > 56 > 8 > 1579 - 1587
IEEE Transactions on Nuclear Science > 2009 > 56 > 4-1 > 1752 - 1757