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Archives of Civil Engineering > 2021 > Vol. 67, nr 2 > 165--180
Acta Obstetricia et Gynecologica Scandinavica > 99 > 7 > 865 - 874
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 50 - 62
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 678 - 682
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 600 - 607
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4084 - 4090
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4175 - 4183
IEEE Transactions on Power Electronics > 2017 > 32 > 9 > 6913 - 6923
IEEE Electron Device Letters > 2017 > 38 > 9 > 1232 - 1235
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 9 > 2402 - 2410
IEEE Transactions on Electromagnetic Compatibility > 2017 > 59 > 4-1 > 1095 - 1102
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 7 > 1181 - 1192
IEEE Transactions on Emerging Topics in Computing > 2017 > 5 > 3 > 304 - 316
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 7 > 1043 - 1049
IEEE Electron Device Letters > 2017 > 38 > 7 > 871 - 874
IEEE Transactions on Power Electronics > 2017 > 32 > 5 > 3777 - 3786
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 5 > 1611 - 1621
IEEE Transactions on Computers > 2017 > 66 > 5 > 786 - 798
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 213 - 220