Search results for: L.M. Yin
Microelectronics Reliability > 2013 > 53 > 1 > 154-163
Journal of Electronic Materials > 2009 > 38 > 10 > 2179-2183
Microelectronics Reliability > 2013 > 53 > 1 > 154-163
Journal of Electronic Materials > 2009 > 38 > 10 > 2179-2183