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IEEE Transactions on Industry Applications > 2017 > 53 > 6 > 5698 - 5708
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 9 > 2561 - 2574
2017 IEEE International Reliability Physics Symposium (IRPS) > 4C-3.1 - 4C-3.5
2017 IEEE International Reliability Physics Symposium (IRPS) > RT-1.1 - RT-1.6
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 69 - 79
2016 IEEE International Electron Devices Meeting (IEDM) > 15.1.1 - 15.1.4
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2405 - 2411
2016 IEEE International Reliability Physics Symposium (IRPS) > 4C-1-1 - 4C-1-5
2016 IEEE International Reliability Physics Symposium (IRPS) > CR-2-1 - CR-2-4
2016 IEEE International Reliability Physics Symposium (IRPS) > 4C-5-1 - 4C-5-7