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IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4175 - 4183
IEEE Electron Device Letters > 2017 > 38 > 9 > 1232 - 1235
2017 IEEE International Reliability Physics Symposium (IRPS) > PM-2.1 - PM-2.5
IEEE Electron Device Letters > 2014 > 35 > 10 > 1019 - 1021