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IEEE Design & Test > 2017 > 34 > 6 > 54 - 62
TENCON 2017 - 2017 IEEE Region 10 Conference > 1037 - 1041
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 10 > 2893 - 2906
IEEE Journal of Solid-State Circuits > 2017 > 52 > 4 > 940 - 949
2016 IEEE International Electron Devices Meeting (IEDM) > 35.5.1 - 35.5.4