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In-circuit tests play a key role in manufacturing electronic devices with a high level of reliability. One of the most flexible technology for the tests is based on flying probes, in which a set of conductive needles is automatically positioned on multiple test points of the device under test. The probes are controlled at high speed within the working space, to increase the production rate, Position...
This paper presents three contributions in the filed of medical imaging applications using hand-held ultrasound probe: 1) a new type of belt-driven mechanism for force-controlled ultrasound probe (FCUS) and 2) a safe and precise position controller and 3) a new algorithm for endpoint avoidance in the limited motion range. To enhance the image quality, the probe-patient contact force is controlled...
This paper presents a capacitive Micro ElectroMechanical System (MEMS) force sensor coupled with a properly-designed interface circuit based on Direct Digital Synthesizer (DDS) that allows tunable sensitivity exploiting an electrical servo-assisted position-feedback mechanism. The position of the probe tip is kept fixed exploiting a feedback loop that includes a variable-gap capacitive position sensor...
This paper presents the design, implementation, and control of a novel microelectromechanical system (MEMS) force sensor. The device features bidirectional electrostatic actuators and on-chip piezoresistive displacement sensors. For the fabrication, a standard silicon-on-insulator process is used. Due to the bidirectional geometry, the probe is able to perform force measurement in both push and pull...
Focus on the design of IC test board based on ATE, discuss about the structure of test board, and some common signal like digital, analog, DPS, etc. That we normally will meet in the IC test board design, research the key points for test board design, and how to improve and ensure the design quality.
Atomic force microscope (AFM) is a useful apparatus for measuring interaction forces between an AFM tip and samples at nanoscale. These forces can be classified into a normal force and a lateral force based on the deformation of AFM cantilever. The reliability of the measurement result is influenced by calibrating the spring constant of the AFM probe directly. However, it is still a challenge to quantitative...
We studied bending of multilayered graphene into 3D structure. In this paper, we proposed a nanogripper folded by multilayered graphene as one of the 3D device. The nanogripper is actuated by electro static forces to open and close. The multilayered graphene was fabricated by focused ion beam (FIB) to form nano-gripper design. Reversible action is realized by controlled two different electrodes. In...
This paper presents an easy-to-use and efficient implementation of the added mass method for calibrating various atomic force microscope (AFM) probes without damage to the probe, which is based on the added mass method. The method is achieved by using a pneumatic control system and a home-made glass micro-pipette. Compared with the conventional added mass method, this method achieves the operation...
The force acting between molecules and substrates is crucial for the manipulation process. Atomic force microscopy (AFM) is not only a versatile tool for imaging in biological research, but also a versatile one for the manipulation of biological molecules. Because of the high mechanical resolution of AFM, it is preferred for the study of the interaction of mechanics in biological systems. This work...
Electromagnetic (EM) waves exert forces on objects. The nonconservative part of these forces is determined by the gradient of phase (wavevector) of EM field. Through special structures, manipulation of the direction of these forces becomes possible. Here we investigate numerically the forces created by left-handed negatively refracting photonic crystals — these can create EM waves with the Poynting...
This paper considers to develop a prototype master-slave robotic system for teleoperated ultrasonography. Six DOF motions for ultrasonography are provided through Stewart-Gough mechanisms for both master/slave devices. As a slave robot, a ultrasound probe is installed inside of the platform and contacts with patients skin through the hole in the base frame to minimize the size of the robot. The master...
Standard haptic rendering algorithms are not well suited for underactuated haptic devices. They compute forces oblivious of underactuation, and then they simply project the resulting forces to the actuated subspace. We propose instead a proxy-based haptic rendering method that computes displacements in the actuated subspace only, and then translates these displacements into force commands using regular...
In this paper we present a novel approach to track and explore stiff tissues within 3-D ultrasound volumes acquired by a medical 3-D ultrasound probe mounted on a six degrees of freedom robotic arm. Autonomous palpation and on-line elastography process are implemented to estimate the elastic property of the tissues (strain) in a volume of interest (VoI) indicated by the user. The compression motion,...
Effective in situ, in vivo tumour margin assessment is an important, yet unmet, clinical demand in surgical oncology. Recent advances in probe-based optical imaging tools such as confocal endomicroscopy is making inroads in clinical applications. In practice, maintaining consistent tissue contact whilst ensuring large area surveillance is crucial for its practical adoption and for this reason there...
This paper presents a surface scanning touch probe with low touch force for micro-CMM. The displacements of the probe are detected by a 2-DOF mechanism, which is comprised of a round frame, a tungsten stylus and a leaf spring fixed to the base. The design of the stylus is mounted at the centre of a stiff round frame, which in turn is fixed to a leaf spring; meanwhile, a live center which is installed...
This paper presents the fabrication and characterization of a mechanical microswitch structures for the out-of-the plane displacements. The mobile electrode is connected to the anchors through several rectangular hinges fabricated in different geometrical dimensions. The mechanical response of investigated switch structures depends on the number of hinges and their geometrical dimensions. The geometrical...
Atomic Force Microscope (AFM) subresonant tapping (SRT), for example, Peak Force QNM mode enables high-resolution imaging of properties such as probe-surface adhesion or viscoelastic dissipation that are typically beyond the capability of other AFM scanning modes. However, SRT is among the slowest methods for obtaining an AFM image. This paper presents a method for increasing the scanning speed of...
Electrical testing method is the most efficient and cost-effective method to determine whether semiconductor chips are defective. In the wafer state, an interface device called a probe card is needed to physically contact with the pad for electrical test. Recently, the environment for wafer test is getting more challenging. This is because of decrease in pad-size due to device shrinkage, and increase...
Landing of the probe is one of the most critical elements of Atomic Force Microscopy (AFM). However, it remains inadequately studied. Practical implementations of landing usually rely on operator experience, ad hoc semi-automation, or both. In this paper, a systematic model-based approach to automatic soft landing of the probe is applied to resonance AFM modes. Analysis shows that landing in frequency...
Minimizing tip-sample interaction force is crucial for the performance of atomic force microscopes when imaging delicate samples. Conventional methods based on jumping mode such as peak force tapping require a prescribed maximum interaction force to detect tip-sample contact. However, due to the presence of drag forces (in aqueous environments), noises and cantilever dynamics, the minimal detectable...
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