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We develop an intelligent credit rating system that can provide debtors' rating information without involving credit rating agencies. Several models are used for credit scoring in our work, including the Duffie's model, logistic regression, and random forest. We compare the performance of these models and build an in-depth understanding of the evaluation of credit rating. Furthermore, we propose a...
Testing of Android apps is particularly challenging due to the fragmentation of the Android ecosystem in terms of both devices and operating system versions. Developers must in fact ensure not only that their apps behave as expected, but also that the apps' behavior is consistent across platforms. To support this task, we propose DiffDroid, a new technique that helps developers automatically find...
There is an increasing availability of high throughput networks which leads to the need of security appliances in these networks. Testing these appliances with regards to performance and effectiveness relies on testing tools that can achieve or even surpass the capabilities of the devices and networks under test. However, current tools are not capable of achieving both the flexibility and performance...
This paper aims toward joining the ideas of OBT (oscillation-based testing) and DFT (design for testability). It gives insight into an optimization process that provides testability if one chooses to use the OBT. The optimization procedure is exemplified on a timer device NE555. Utilization of a timer circuit allows avoidance of a specific design of the feed-back loop. The optimization procedure is...
Analog-to-Digital Converters (ADCs) are becoming increasingly common to be involved in most systems in Integrated Circuits (ICs). Thanks to the rapid growth of modern semiconductor technology, the performance of the data converters becomes better and better. One of the difficulties being faced is to be able to accurately and cost-effectively test the continually better performance ADCs. The conventional...
Spectral testing and linearity testing are two important categories in ADC testing. The sampling clock quality is a crucial factor in ADC spectral testing. The cumulative clock jitter of the sampling clock generates power leakage in the fundamental component of the ADC output spectrum, and the random clock jitter increases the noise floor of the ADC output spectrum, which corrupts the spectrum result...
Transient voltage suppressor (TVS) device is the chief way by which the susceptibility to Electromagnetic pulse (EMP) of equipment can be decrease. Prior to each application, the TVS device has to be tested in order to evaluate its performances. In this paper, a new EMP protection performance testing system is designed and the Suppressing characteristics of four kinds of TVS device during EMP stressing,...
Today, performing life tests on power semiconductor devices is of major importance in industrial and automotive power applications. Traditionally, qualification tests, like the HTOL test, are carried out in a semi-automated manner. This paper first reviews different test methods and a recently proposed modular test system (MTS) that allows testing of individual devices as well as application specific...
Various networking applications and systems must be tested before the final deployment. Many of the tests are performed on network testbeds such as Emulab, PlanetLab, etc. These testbeds are large in scale and organize devices in relatively fixed ways. It is difficult for them to incorporate the latest personalized devices, such as smart watches, smart glasses and other emerging gadgets, so they tend...
Single-event effects and total ionizing-dose testing was performed on a flash NAND device. The results are presented here and the consequences for error correction architectures are analyzed taking into account the fact that beginning-of-life flash devices are susceptible to data corruption with no external stress applied. The analysis indicates that many typical error correction architectures may...
We provide a brief discussion of the basic enhancement mode gallium nitride (GaN) power FET device structure and its performance and then report the results of displacement damage (DD) testing of the Intersil ISL70023SEH and ISL70024SEH GaN power transistors.
Total ionizing dose and single event effects testing was performed on 4 Gb NAND flash die used in DDC's 69F24G24 flash NAND devices. If the data is regularly refreshed, the devices show good resistance to corrupted bits during total dose irradiation. In the case of heavy ion irradiation, multi-bit upsets could prove problematic to some error correction schemes.
We provide a brief discussion of the basic enhancement mode gallium nitride (GaN) power FET device structure and its performance and then report the results of destructive single-event effects (SEE) testing of the Intersil ISL70023SEH and ISL70024SEH GaN power transistors. We include a discussion of a conservative safe operating area (SOA) specification for both devices.
Vroton induced SEU cross-section of DSP cores within the KeyStone™ II system-on-chip 66AK2L06 is presented. Upset rates in the space radiation environment are estimated.
Single Events Effect (SEE) characterization results for LVPECL 1:10 Clock Distributor is summarized, showing very robust SEE performance up to LETeff=69.2 MeV-cm2/mg.
Total dose test results are presented for the Maxim 1257/1258 multi-channel ADC/DAC, and the Linear Technology LTC2378-20 low power SAR ADC. The paper discusses radiation testing challenges of complex mixed signal circuits.
We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
It is well known that the fragmentation of Android ecosystem has caused severe compatibility issues. Therefore, for Android apps, cross-platform testing (the apps must be tested on a multitude of devices and operating system versions) is particularly important to assure their quality. Although lots of cross-platform testing techniques have been proposed, there are still some limitations: 1) it is...
This research work proposes a novel algorithm for evaluating the quality of Received Signal Strength (RSS) fingerprint databases, utilized by positioning systems. The proposed “Tolerance Based - Normal Probability Distribution (TBNPD)” correlation algorithm, calculates the correlation level between each pair of fingerprint entries forming the radiomap. Possible RSS fluctuations, occurring due to the...
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