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The paper describes the dependence of the SEU cross-section on the clock frequency for a CMOS 0.18um microprocessor's test chip. An attempt has been made to find the relationship between the parameter of the minimum supply voltage and the frequency dependence of the SEU. Original experimental results are obtained.
In this paper some popular techniques of analog-to-digital converter parameters measurement are compared. The structure of the proposed software-hardware complex and experiment procedure are described. Experimental results are presented.
This paper presents the system that allows SEFI modelling by means of injecting upsets in different microcontroller memory blocks, carrying out its functional control and detect the moment when SEFI occurs. Test setup was developed on the basis of National Instruments PXI modular equipment and LabVIEW software. Developed fault injection system was tested on PIC17 microcontroller. The comparison between...
The developed automated setup for functional and parametric control of 8-bit microcontrollers during radiation hardness tests is presented. The setup hardware is based on the NI modular instruments PXI-7841R and PXI-4110 operated under LabVIEW software. Test circuit and methods together with the user software structure and typical test results are presented.
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