Search results for: D.V. Boychenko
Microelectronics Reliability > 2016 > 64 > C > 130-133
Microelectronics Reliability > 2015 > 55 > 9-10 > 1527-1531
IEEE Transactions on Nuclear Science > 2006 > 53 > 4-1 > 1981 - 1987
Microelectronics Reliability > 2016 > 64 > C > 130-133
Microelectronics Reliability > 2015 > 55 > 9-10 > 1527-1531
IEEE Transactions on Nuclear Science > 2006 > 53 > 4-1 > 1981 - 1987