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Physically Unclonable Functions (PUFs) offer enticing possibilities to incorporate hardware-based security on semiconductor device level. In order to make efficient use of PUF functionality in lightweight cryptographic applications, a low-overhead implementation in terms of chip area and power consumption is required. In this paper a fully differential readout circuit is proposed that allows the generation...
The understanding and controlling of semiconductor process variation is crucial to the performance, functionality and reliability of modern ICs. Due to the complex fabrication process involving hundreds of processing steps, the analysis of the sources of variability is a non-trivial task. In this paper, a novel, simple-to-implement procedure named Hierarchical Median Polish is proposed. The method...
The level of security provided by physically unclonable functions (PUFs) strongly depends on the unpredictability of its challenge-response behavior. Systematic variation in the properties of a PUF might introduce correlations in the output bits. The mutual dependence of response bits is typically not detected by conventional methods, thus leaving the PUF vulnerable to prediction attacks. New methods...
We investigated the leakage current of thin film silicon-on-insulator (SOI) pin-diodes in dependence of the back-gate potential and hot carrier induced traps. Leakage current of virgin and hot-carrier stressed diodes was measured at distinct back-gate potentials. TCAD simulations were used to determine the mechanisms of leakage current generation at specific back-gate potentials. Traps were introduced...
Today an increasing number of applications in fields like power electronics or sensor signal conditioning are demanding for integrated circuits supporting an extended temperature range. Mixed signal circuits featuring analog circuitry, analog to digital converters as well as embedded microcontrollers and on-chip memories are requested to operate up to 300°C or even more. This paper outlines technological...
In recent years CMOS image sensors have gained a major market share for general imaging applications. However, when standard CMOS image sensors are employed in applications that require the detection of light with a very small spectral width, like 3D-time-of-flight imaging or other applications with laser light illumination, problems arise, that are negligible in standard imaging applications with...
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